Title of article :
Development of an instrument for simultaneous detection of
positive and negative scanning ion images
Author/Authors :
S. Seki، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
We have developed an instrument that can simultaneously detect positive and negative scanning ion images of the same
location on the same sample. It consists of a primary ion irradiating column, sample chamber, detection system for secondary
ions and data processing and imaging system. The scanning ion probe uses a gallium liquid metal ion source with a sealed-conetype
reservoir. Positive and negative secondary ions sputtered from the same point on a sample by the scanned gallium ion beam
are simultaneously extracted and converted into electrons at two separate ion–electron converters. The electrons are then
accelerated toward scintillators to generate light signals, which are then detected by means of photomultipliers. The output
signals of the negative and positive ion detector are then simultaneously processed by the data acquisition system in
synchronization with the primary ion scanning signal.
# 2004 Elsevier B.V. All rights reserved
Keywords :
Ga-LMIS , Focused ion beam , Scanning ion image , Secondary ion image , Liquid metal ion source
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science