Title of article :
Total internal reflection fluorescence microscopy—a powerful tool to study single quantum dots
Author/Authors :
A.Yu. Kobitskia، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
7
From page :
86
To page :
92
Abstract :
We present total internal reflection fluorescence microscopy (TIRFM) measurements of colloidal CdSe quantum dots (QDs). This technique provides the advantage of recording the time-resolved fluorescent signal of many single QDs simultaneously, thus allowing data with high statistical confidence to be obtained in a relatively short time. We discuss methods of taking and extracting the data from the collected images, and in particular, investigate the on/off intermittent fluorescence behavior from single QDs over a range of excitation intensities.We find that on/off-times are independent of the excitation power at intensities above 0.2 kW/cm2, while at lower intensities, there is a pronounced dependence. We discuss the observed behavior in terms of current physical models of QD ionization and neutralization, which are often used to explain the on and off blinking. # 2004 Elsevier B.V. All rights reserved
Keywords :
quantum dots , Single particle spectroscopy , Fluorescenceintermittency , Total internal reflection fluorescence microscopy (TIRFM)
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
998702
Link To Document :
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