• Title of article

    Total internal reflection fluorescence microscopy—a powerful tool to study single quantum dots

  • Author/Authors

    A.Yu. Kobitskia، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    7
  • From page
    86
  • To page
    92
  • Abstract
    We present total internal reflection fluorescence microscopy (TIRFM) measurements of colloidal CdSe quantum dots (QDs). This technique provides the advantage of recording the time-resolved fluorescent signal of many single QDs simultaneously, thus allowing data with high statistical confidence to be obtained in a relatively short time. We discuss methods of taking and extracting the data from the collected images, and in particular, investigate the on/off intermittent fluorescence behavior from single QDs over a range of excitation intensities.We find that on/off-times are independent of the excitation power at intensities above 0.2 kW/cm2, while at lower intensities, there is a pronounced dependence. We discuss the observed behavior in terms of current physical models of QD ionization and neutralization, which are often used to explain the on and off blinking. # 2004 Elsevier B.V. All rights reserved
  • Keywords
    quantum dots , Single particle spectroscopy , Fluorescenceintermittency , Total internal reflection fluorescence microscopy (TIRFM)
  • Journal title
    Applied Surface Science
  • Serial Year
    2004
  • Journal title
    Applied Surface Science
  • Record number

    998702