Title of article
Total internal reflection fluorescence microscopy—a powerful tool to study single quantum dots
Author/Authors
A.Yu. Kobitskia، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
7
From page
86
To page
92
Abstract
We present total internal reflection fluorescence microscopy (TIRFM) measurements of colloidal CdSe quantum dots
(QDs). This technique provides the advantage of recording the time-resolved fluorescent signal of many single QDs
simultaneously, thus allowing data with high statistical confidence to be obtained in a relatively short time. We discuss
methods of taking and extracting the data from the collected images, and in particular, investigate the on/off intermittent
fluorescence behavior from single QDs over a range of excitation intensities.We find that on/off-times are independent of the
excitation power at intensities above 0.2 kW/cm2, while at lower intensities, there is a pronounced dependence. We discuss
the observed behavior in terms of current physical models of QD ionization and neutralization, which are often used to
explain the on and off blinking.
# 2004 Elsevier B.V. All rights reserved
Keywords
quantum dots , Single particle spectroscopy , Fluorescenceintermittency , Total internal reflection fluorescence microscopy (TIRFM)
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
998702
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