Title of article :
High performance rf front end circuits using SiGe:C BiCMOS þ copper technologies
Author/Authors :
Glenn Watanabe*، نويسنده , , Jeff Ortiz، نويسنده , , Rick Holbrook، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
405
To page :
409
Abstract :
Using a first generation standard silicon germanium (SiGe):C HBT BiCMOS process, a personal digital cellular (PDC) LNA noice factor (NF) of 1.0 dB at 850 MHz and 1.2 dB at 1.5 GHz has been achieved. The LNA NF can be further reduced by using the second generation enhanced SiGe:C HBT BiCMOS process. The mixer performance is equally impressive. The NF of the downconversion mixer at 1.5 GHz is just 6.2 dB with a conversion gain of 12 dB. The mixer IIP3 is þ9.9 dBm at a current drain of 5.6 mA. Design techniques are given on how to achieve high linearity with minimal current drain resulting in a 881 MHz LNAwith an IIP3 of þ12.4 dBm with just 6 mA of current and a NF of 1.4 dB using the first generation SiGe:C HBT BiCMOS process. The second generation enhanced SiGe:C HBT BiCMOS process should further reduce the noise figure. # 2003 Elsevier B.V. All rights reserved
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
999228
Link To Document :
بازگشت