Title of article :
High performance rf front end circuits using SiGe:C
BiCMOS þ copper technologies
Author/Authors :
Glenn Watanabe*، نويسنده , , Jeff Ortiz، نويسنده , , Rick Holbrook، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Abstract :
Using a first generation standard silicon germanium (SiGe):C HBT BiCMOS process, a personal digital cellular (PDC) LNA
noice factor (NF) of 1.0 dB at 850 MHz and 1.2 dB at 1.5 GHz has been achieved. The LNA NF can be further reduced by
using the second generation enhanced SiGe:C HBT BiCMOS process. The mixer performance is equally impressive. The NF
of the downconversion mixer at 1.5 GHz is just 6.2 dB with a conversion gain of 12 dB. The mixer IIP3 is þ9.9 dBm at a
current drain of 5.6 mA. Design techniques are given on how to achieve high linearity with minimal current drain resulting
in a 881 MHz LNAwith an IIP3 of þ12.4 dBm with just 6 mA of current and a NF of 1.4 dB using the first generation SiGe:C
HBT BiCMOS process. The second generation enhanced SiGe:C HBT BiCMOS process should further reduce the noise
figure.
# 2003 Elsevier B.V. All rights reserved
Journal title :
Applied Surface Science
Journal title :
Applied Surface Science