• Title of article

    Kinetics of bulk point defects in the growth of nanocavities in crystalline Ge

  • Author/Authors

    S.H. Lee and J.C. Kim ، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2004
  • Pages
    5
  • From page
    19
  • To page
    23
  • Abstract
    Nanocavities created in Ge(111) by 5 keV Xe ion irradiation are characterized by ex situ transmission electron microscopy (TEM). Nanocavities with average diameter of 10 nm are observed at 500 8C, while nanocavities with average diameter of 2.9 nm are observed at 400 8C. The nanocavities grow beyond equilibrium size at 500 8C mainly due to absorption of vacancies produced during 5 keV Xe ion irradiation. The sink strengths of the nanocavities and the Ge surface for absorption of interstitials and vacancies are examined to elucidate the growth of the nanocavities in the absence of apparent biased sinks such as dislocations. # 2004 Elsevier B.V. All rights reserved
  • Keywords
    Nanocavity , TRANSMISSION ELECTRON MICROSCOPY , Sink strength , Vacancy , interstitial
  • Journal title
    Applied Surface Science
  • Serial Year
    2004
  • Journal title
    Applied Surface Science
  • Record number

    999451