Title of article :
Sputtering of a polycyclic hydrocarbon molecule: TOF–SIMS experiments and molecular dynamic simulations
Author/Authors :
V. Solomko، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
6
From page :
48
To page :
53
Abstract :
This study focuses on the desorption and ionization processes of an aromatic molecule containing several phenyl rings, 1,2,3,4-tetraphenylnaphthalene (TPN), adsorbed on a Au surface, via the comparison of experimental secondary ion mass spectrometry (SIMS) data and molecular dynamic (MD) simulations. The mass spectra and kinetic energy distribution (KED) measurements were obtained using both TOF–SIMS and MD simulation methods. For entire TPN molecules, a good agreement is observed between the calculated and experimental KEDs, except for high energies, where they start diverging. This difference is partly caused by the unimolecular dissociation of internally excitedmolecules over larger time intervals than those considered in the simulation. In turn, using an internal energy threshold to remove the most excited molecules from the calculated KEDs provides a better agreement with the experiment. TheMD simulations also show that molecules surrounding the impact point of the projectile are sputtered with more kinetic energy and shorter emission times than molecules located farther away fromit. The distinct emissionmechanisms inducing these different energy spectra are identified by the analysis of the simulation results. # 2004 Elsevier B.V. All rights reserved.
Keywords :
Secondary ion spectrometry , Molecular dynamics simulations , Sputtering , ION EMISSION
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
999559
Link To Document :
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