Title of article :
ToF-SIMS imaging with cluster ion beams
Author/Authors :
J. Xu، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2004
Pages :
5
From page :
159
To page :
163
Abstract :
Molecule-specific imaging using focused ion beams is one of the most powerful applications of ToF-SIMS and offers unique surface characterization information. However, many experiments lack the necessary sensitivity to properly take advantage of the sub-100 nm probe size typical of liquid metal ion sources. The yield of biomolecules using Gaþ ions, for example, is very small when compared to that obtained using Csþ ion or SF5þ cluster ion sources. Most recently, a C60þ source with a probe size approaching 1 10 6 m has become available and offers promise to expand imaging applications dramatically. Here, we report on imaging experiments on 50 10 6 m polystyrene resin particles used in solid phase synthesis of combinatorial libraries and on the assay of the membrane chemistry of single biological cells. Both of these examples allow much higher quality images to be acquired with, in some cases, almost no sample damage. This latter effect opens the possibility of three-dimensional molecule-specific imaging. # 2004 Elsevier B.V. All rights reserved
Keywords :
ToF-SIMS imaging , Cluster sources , biological cells , combinatorial chemistry
Journal title :
Applied Surface Science
Serial Year :
2004
Journal title :
Applied Surface Science
Record number :
999582
Link To Document :
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