Title of article
ToF-SIMS imaging with cluster ion beams
Author/Authors
J. Xu، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
159
To page
163
Abstract
Molecule-specific imaging using focused ion beams is one of the most powerful applications of ToF-SIMS and offers unique
surface characterization information. However, many experiments lack the necessary sensitivity to properly take advantage of
the sub-100 nm probe size typical of liquid metal ion sources. The yield of biomolecules using Gaþ ions, for example, is very
small when compared to that obtained using Csþ ion or SF5þ cluster ion sources. Most recently, a C60þ source with a probe size
approaching 1 10 6 m has become available and offers promise to expand imaging applications dramatically. Here, we report
on imaging experiments on 50 10 6 m polystyrene resin particles used in solid phase synthesis of combinatorial libraries and
on the assay of the membrane chemistry of single biological cells. Both of these examples allow much higher quality images to
be acquired with, in some cases, almost no sample damage. This latter effect opens the possibility of three-dimensional
molecule-specific imaging.
# 2004 Elsevier B.V. All rights reserved
Keywords
ToF-SIMS imaging , Cluster sources , biological cells , combinatorial chemistry
Journal title
Applied Surface Science
Serial Year
2004
Journal title
Applied Surface Science
Record number
999582
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