Author/Authors :
G.، Freeman, نويسنده , , D.، Ahlgren, نويسنده , , B.، Jagannathan, نويسنده , , Rieh، Jae-Sung نويسنده , , S.، Subbanna, نويسنده , , M، Meghelli, نويسنده , , K، Chan, نويسنده , , K.، Schonenberg, نويسنده ,
Abstract :
We show empirical results that demonstrate the effect of high performance SiGe HBT design parameters on the minimum gate delay of an ECL ring oscillator. SiGe HBT devices with a high f/sub MAX/ (338 GHz) and a low f/sub T/ (180 GHz) achieve a minimum delay of 3.9 ps, which to our knowledge is the lowest reported delay for a silicon based logic gate. Compared to the extracted (extrapolated) f/sub T/ and f/sub MAX/, a simple figure of merit proportional to (radical)f/sub T//R/sub B/C/sub CB/ with R/sub B/ and C/sub CB/ extracted from S-parameter measurement is best correlated to the minimum gate delay.