Title of article :
Self-oscillation technique for AFM in liquids
Author/Authors :
Takaharu Okajima، نويسنده , , Hiroshi Sekiguchi، نويسنده , , Hideo Arakawa، نويسنده , , Atsushi Ikai، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
5
From page :
68
To page :
72
Abstract :
A simple self-oscillation circuit was built into a commercially available atomic force microscope (AFM) apparatus and used for imaging sample surfaces with a high rigidity in liquid environments. Imaging experiments were conducted with an AFM tip recommended for the normal tapping (intermittent contact) mode in liquids. In spite of the existence of many artificial resonance peaks, the self-oscillation could be successfully achieved with our simple electronic circuits. Force curves obtained in liquids showed that, as the tip contacted the surface, the resonance frequency began to increase steeply without a clear reduction of the vibration amplitude. Image of the sample surface was stably obtained under the condition of the positive frequency shift within a few Hertzs, which corresponded to a contact force comparable with Q-control operation.
Keywords :
Atomic force microscope , Self-oscillation , Tapping mode , Dynamic force microscope , Imaging in liquid
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
999894
Link To Document :
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