Title of article :
Observation of stretched single DNA molecules by Kelvin probe force microscopy
Author/Authors :
K.J. Kwak، نويسنده , , S. Yoda، نويسنده , , M. Fujihira، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
73
To page :
78
Abstract :
Lambda bacteriophage deoxyribonucleic acid (DNA) molecules stained with YOYO-1 were deposited and stretched on chemically modified Si(1 0 0) wafer and cover glass substrates. The Si(1 0 0) wafer with a natural oxide layer and the cover glass surface were first chemically modified by vapor phase chemisorption with mixed two organosilanes. DNA molecules were then aligned on the substrate surfaces by chemical and physical adsorption from an aqueous solution during molecular combing. The aligned DNA molecules were observed by Kelvin probe force microscopy and intermittent contact-mode atomic force microscopy (AFM) as well as fluorescence microscopy. Interaction between the stretched DNA molecules and the chemically modified Si(1 0 0) substrate surface was examined using these AFMs.
Keywords :
Stretched DNA , Molecular combing , Kelvin probe force microscopy , atomic force microscopy
Journal title :
Applied Surface Science
Serial Year :
2003
Journal title :
Applied Surface Science
Record number :
999895
Link To Document :
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