Author/Authors :
Christopher S. Blackman، نويسنده , , Claire J. Carmalt، نويسنده , , Shane A. O’Neill، نويسنده , , Ivan P. Parkin، نويسنده , , Leonardo Apostolico، نويسنده , , Kieran C. Molloy، نويسنده ,
Abstract :
Thin films of titanium(III) phosphide (TiP) have been produced from the dual-source atmospheric pressure CVD reaction of TiCl4 and tristrimethylsilylphosphine. Analysis of the films using EDAX, SEM, glancing angle XRD and XPS is presented.
Keywords :
Tristrimethylsilylphosphine , CVD , Titanium phosphide , Thin film