Title :
Growth and Critical Layer Thickness Determination of Indium Gallium Nitride Films Grown on Gallium Nitride
Author :
Robert J. Nemanich استاد مشاور , Salah M. Bedair استاد راهنما , James F. Kauffman استاد مشاور , Kwiok Kim استاد مشاور
University :
Raleigh North carolina state university
Major :
PhD )Electrical Engineering(
Keyword :
gallium phosphide , band gap dependence on composition , critical layer thickness , Photodetectors , indium gallium nitride , bowing parameter , netal organic chemical vapor deposition
