Title :
Finite Element Analysis of Probe Induced Delamination of a Thin Film at an Edge Interface
Author :
David A. Dillard استاد مشاور , Kai-tak Wan استاد مشاور , Robert L. West Jr. استاد راهنما
University :
Virginia Polytechnic Institute and state University
Major :
Master of Science )Mechanical Engineering(
Keyword :
half-blister , adhesive blister test , Finite elements , energy release rates
