DocumentCode
11384
Title
Finite Element Analysis of Probe Induced Delamination of a Thin Film at an Edge Interface
Author
David A. Dillard استاد مشاور , Kai-tak Wan استاد مشاور , Robert L. West Jr. استاد راهنما
University
Virginia Polytechnic Institute and state University
Grade
نامعلوم
Major
Master of Science )Mechanical Engineering(
Number of pages
0
Publish Date
2002
Keyword
half-blister , adhesive blister test , Finite elements , energy release rates
Note
01
Language
انگليسي
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