DocumentCode :
19770
Title :
Investigation of Measurement Artifacts Introduced By Horizontal Scanning Surface Profiling Instruments
Author :
Christopher A. Brown استاد راهنما
University :
WPI
Grade :
نامعلوم
Major :
MS )Manufacturing Engineering(
Number of pages :
0
Publish Date :
1999
Keyword :
Surface Metrology , surface , fractal , Anisotropy , Scanning Instruments , Scanning
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=19770
