DocumentCode :
22922
Title :
On Chip Characterization of Single Event Transient Pulse Widths
Author :
Ronald D. Schrimpf استاد راهنما , Bharat L. Bhuva استاد مشاور
University :
Vanderbilt University
Grade :
نامعلوم
Major :
Master of Science )Electrical Engineering(
Number of pages :
0
Publish Date :
2005
Keyword :
CMOS , single event , set , transient pulse width , RHBD , SEU
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=22922
