DocumentCode :
22964
Title :
In situ laser etch-depth monitoring of the deep reactive ion etching process
Author :
Chin Ken K. استاد مشاور , Farmer Kenneth Rudolph استاد راهنما
University :
Van Houten Library )new Jersey Institute Of Technology(
Grade :
نامعلوم
Major :
Master of Science )Materials Science and Engineering(
Number of pages :
0
Publish Date :
2003
Keyword :
Deep refractive ion etching , Laser etch-depth monitoring
Note :
01
Language :
انگليسي
Link To Document :
بازگشت