DocumentCode
23005
Title
ANALYSIS OF SCHOTTKY DIODE FAILURE MECHANISMS DURING EXPOSURE TO ELECTRON BEAM PULSE USING TCAD SIMLULATION
Author
D. Greg Walker استاد مشاور , Ronald Schrimpf استاد راهنما
University
Vanderbilt University
Grade
نامعلوم
Major
Master of Engineering )Electrical Engineering(
Number of pages
0
Publish Date
2002
Note
01
Language
انگليسي
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