Title :
The Radiation Response and Long Term Reliability of High-k gate dielectrics
Author :
Lloyd Massengill استاد مشاور , Robert Weller استاد مشاور , Dan Fleetwood استاد راهنما
University :
Vanderbilt University
Major :
PhD )Electrical Engineering(
Keyword :
alternative gate dielectric , High-k , Reliability , radiation
