DocumentCode
23597
Title
Formation and characterization of n/p shallow junctions in sub-micron MOSFETs
Author
Fiory Anthony استاد مشاور , Ravindra N. M. استاد راهنما
University
Van Houten Library )new Jersey Institute Of Technology(
Grade
نامعلوم
Major
Master of Science )Materials Science and Engineering(
Number of pages
0
Publish Date
2002
Keyword
Semiconductors , Leakage Current
Note
01
Language
انگليسي
Link To Document