DocumentCode :
23776
Title :
Formation characterization of p/n shallow junctions in sub-micron MOSFETs
Author :
Fiory Anthony استاد مشاور , Ravindra N. M. استاد راهنما , Ivanov Dentcho V استاد مشاور
University :
Van Houten Library )new Jersey Institute Of Technology(
Grade :
نامعلوم
Major :
Master of Science )Materials Science and Engineering(
Number of pages :
0
Publish Date :
2002
Keyword :
Sub-micron MOSFETs , Shallow junctions , Complementary metal oxide semiconductors )CMOS(
Note :
01
Language :
انگليسي
Link To Document :
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