DocumentCode :
24282
Title :
Study of MOSFET degradation under substrate injection and hot carrier degradation
Author :
Carr William N. استاد مشاور , Misra Durgamadhab استاد راهنما
University :
Van Houten Library )new Jersey Institute Of Technology(
Grade :
نامعلوم
Major :
Master of Science )Department of Electrical and Computer Engineering(
Number of pages :
0
Publish Date :
2003
Keyword :
High-field substrate injection , MOSFET degradation
Note :
01
Language :
انگليسي
Link To Document :
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