DocumentCode :
26209
Title :
A Comprehensive Study of Safe-Operating-Area, Biasing Constraints, and Breakdown in Advanced SiGe HBTs
Author :
John Papapolymerou استاد مشاور , Emmanouil M. Tentzeris استاد مشاور , John D. Cressler استاد راهنما
University :
Georgia Institute Of Technology
Grade :
نامعلوم
Major :
Master of Science
Number of pages :
0
Publish Date :
2005
Keyword :
impact ionization , avalanche multiplication , BVCBO , BVCEO , Breakdown , SiGe HBTs , BICMOS
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=26209
