26648

A Survey of High Level Test Generation: Methodologies and Fault Models

Diva Partal academic Arshive Online

نامعلوم

Report

0

2005

Systems on Chip , Operator mutation , Hierarchical test pattern generation , Test , Test Pattern Generation , Behavior level design , Fault Simulation , Fault models , Design for Testability , Fault Coverage , Abstraction levels

01

انگليسي