DocumentCode :
26787
Title :
Studying material properties on the nanometer scale: instrumental development and applications
Author :
Harry B. Gray استاد راهنما , Jesse L. Beauchamp استاد مشاور , John D. Baldeshweiler استاد مشاور
University :
Caltech Library System
Grade :
نامعلوم
Major :
PhD
Number of pages :
0
Publish Date :
1995
Keyword :
nanometer , atomic force microscopy , material properties , near-field optical microscopy
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=26787
