DocumentCode :
27065
Title :
An Efficient Built-In Self-Diagnostic Method for Non-Traditional Faults of Embedded Memory Arrays
Author :
Wen-Ben Jone استاد راهنما
University :
OhioLINK
Grade :
نامعلوم
Major :
MS, University of Cincinnati, Engineering : Computer Engineering
Number of pages :
0
Publish Date :
2002
Keyword :
Memory , diagnosis , built-in-self-diagnosis , system on chip , embedded memory arrays
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=27065
