DocumentCode :
31627
Title :
Calibration of a microvision system for MEMS device characterization Calibration of a microvision system for microelectromechanical system device characterization
Author :
Stephen D. Senturia. استاد راهنما
University :
DSpace MIT Libraries
Grade :
نامعلوم
Major :
Thesis )M.Eng.( )Massachusetts Institute of Technology, Dept.(
Number of pages :
0
Publish Date :
2001
Keyword :
Electrical Engineering and Computer Science
Note :
01
Language :
انگليسي
Link To Document :
بازگشت