مرکز منطقه ای اطلاع رساني علوم و فناوري - Characterization of ultrathin gate dielectrics and multilayer charge injection barriers

DocumentCode :

3435

Title :

Characterization of ultrathin gate dielectrics and multilayer charge injection barriers

Author :

Chin Ken K. استاد راهنما , Tompa Gary S. استاد مشاور

University :

Van Houten Library )new Jersey Institute Of Technology(

Grade :

دكتري

Major :

Doctor of Philosophy )Applied Physics(

Number of pages :

Publish Date :

2004

Keyword :

Nonvolatile memory , Gate dialectrics , Ultrathin oxide , Oxide degradation , Layered tunnel barrier , Electron tunneling

Note :

Language :

انگليسي

Link To Document :