DocumentCode :
4416
Title :
Radiative properties of silicon wafers with microroughness and thin-film coatings
Author :
Zhang Zhuomin M. استاد راهنما , Gallivan Martha استاد مشاور
University :
Georgia Institute Of Technology
Grade :
دكتري
Major :
Doctor of Philosophy
Number of pages :
0
Publish Date :
2006
Keyword :
Silicon , anisotropic roughness , ray-tracing method , Rough surface , radiative property , BRDF
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=4416
