DocumentCode :
5876
Title :
Metal Contacts to Silicon Carbide and Gallium Nitride Studied with Ballistic Electron Emission Microscopy
Author :
Jonathan Pelz استاد راهنما
University :
OhioLINK ETD
Grade :
دكتري
Major :
Doctor of Philosophy, Ohio State University, Physics
Number of pages :
0
Publish Date :
2001
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=5876
