DocumentCode :
5976
Title :
A methodology for characterizing and introducing MOSFET imperfections in analog top-down synthesis and bottom-up validation
Author :
Jespers Paul استاد مشاور , Herve Yannick استاد راهنما
University :
UCL )Les Bibliotheques de L,Universite Catholique de Louvain(
Grade :
دكتري
Major :
FSA 3 - Doctorat en sciences appliquees
Number of pages :
0
Publish Date :
2005
Keyword :
Design flow , Deep-submicron technologies , HALO , automated synthesis , harmonic distortion , Mismatch , high temperature , MOSFET , Sigma-delta modulator
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=5976