DocumentCode
9110
Title
Mobility Degradation of Advanced CMOS Devices
Author
Veena Misra استاد راهنما , Griff Bilbro استاد مشاور , Eric Vogel استاد مشاور , Gerry Lucovsky استاد مشاور , Jayant Baliga استاد مشاور
University
Raligh North Carolina state university
Grade
نامعلوم
Major
PhD )Electrical Engineering(
Number of pages
0
Publish Date
2005
Keyword
bulk trapping , interface traps , Interfaces , charge pumping , MOSFET , high k dielectrics , metal gate electrodes
Note
01
Language
انگليسي
Link To Document