DocumentCode :
9793
Title :
Flip Chip testing with a capacitive coupled probe chip.
Author :
Rhett Davis استاد مشاور , Paul Franzon استاد راهنما , Dennis Bahler استاد مشاور
University :
Virginia Polytechnic Institute nad State University
Grade :
نامعلوم
Major :
PhD )Electrical Engineering(
Number of pages :
0
Publish Date :
2003
Keyword :
multichip module , area array I/O , superscalar processor , process design kit
Note :
01
Language :
انگليسي
Link To Document :
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