DocumentCode
9793
Title
Flip Chip testing with a capacitive coupled probe chip.
Author
Rhett Davis استاد مشاور , Paul Franzon استاد راهنما , Dennis Bahler استاد مشاور
University
Virginia Polytechnic Institute nad State University
Grade
نامعلوم
Major
PhD )Electrical Engineering(
Number of pages
0
Publish Date
2003
Keyword
multichip module , area array I/O , superscalar processor , process design kit
Note
01
Language
انگليسي
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