DocumentCode :
9982
Title :
CHARACTERIZATION OF HIGH-K GATE STACKS IN METAL-OXIDE-SEMICONDUCTOR CAPACITORS
Author :
Gerald Lucovsky استاد مشاور , Veena Misra استاد مشاور , John J. Hren استاد مشاور , Dennis M. Maher Chair استاد راهنما
University :
Raleigh North carolina state university
Grade :
نامعلوم
Major :
PhD )Material Science and Engineering(
Number of pages :
0
Publish Date :
2000
Note :
01
Language :
انگليسي
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=17&DC=9982
