3632

Low Power, and Highly Reliable Single Event Upset Immune Latch for Nanoscale CMOS Technologies

Ramin Rajaei ,

latch , single event upset (SEU) , radiation hardening , soft errors , SEU immunity , low power design

ايران

Abdolah Amirany

latch, single event upset (SEU), radiation hardening, soft errors, SEU immunity, low power design