شماره ركورد كنفرانس :
4014
عنوان مقاله :
Investigation of variation of porous silicon structure using metal-assisted chemical etching
پديدآورندگان :
Mahmoudi Sh Materials and Energy research center , Eshraghi M.J. Materials and Energy research center , Naderi N Materials and Energy research center , Yarmand B Materials and Energy research center
كليدواژه :
Silver nanoparticles , HF–H2O2 solutions , Assisted etching , Porous silicon Fig.1. FE , SEM images of p , Si (100) samples after HF , H2O2 etching for different concentration of H2O2 relative to HF (a)0.78M , (b)0.88M , and (c)1.01M Fig.2. (left) XRD pattern of porous silicon wafers with 0.78M , (b)0.88M , and (c)1.01M (right) Reflection spectra of etched wafers , (a)0.78M , (b)0.88M , (c)1.01M , and (d)free Si wafer
عنوان كنفرانس :
دوازدهمين سمينار سالانه الكتروشيمي ايران
چكيده فارسي :
Metal-assisted etching procedure is an inexpensive, easy, and efficient method to create porous
structures which are the potential candidate in photovoltaic industry [1]. Porous structures due to
their great applications in optoelectronics, sensors, solar cells has been attracted great attentions
[2-5]. In this research metal-assisted etching of silicon in HF/H2O2/H2O mixture was
investigated by using Ag nanoparticles as catalyst agents. So we changed the concentration of
H2O2 relative to HF to creation of various structures and characterization of their properties such
as anti-reflection properties. FE-SEM images and etch rate measurements were performed as a
function of the etching solution mixture. Depending on the relative amount of HF and H2O2,
different morphology and structures were resulted. The molar ratio of HF, H2O2 is given in
table1. The XRD analysis was done to investigate the structure formation and found that the
sample which is immersed into an aqueous solution of HF/H2O2 and molar ratio (7/0.88) has the
best porous structure and shows that the sample3 has a structure similar to the free single crystal
wafer because of its peak is sharp and has high intensity. The anti-reflection properties of porous
layer was investigated to trapping the sun light and found that the sample2 is the most appropriate
one.
Table1. The combination of etching solution and the pore size of silicon wafers
Solution Molar concentration of HF Molar concentration of H2O2
1 7 0.78
425
2 7 0.88
3 7 1.01