SET and SEU Effects on a PLASMA Processor Assessment

The fault tolerance behavior of a PLASMA processor has been evaluated in this article. It is based on a simulation-based method. A VHDL model of such processor is employed to assess its robustness against SET and SEU faults. 11000 various fault models have been injected into 110 different targets in the HDL model of a PLASMA processor. These sorts of fault models are activated while three different workloads are run, separately to find the most tenuous component. According to the experimental results almost 63% of real injected faults resulted in a system failure while nearly 36% of them are recovered without any effects on the functionality of the PLASMA processor. Multiplier, Memory controller, and Program counter have been known as the three most tenuous components with the failure rate of 58%, 50%, and 44%, respectively.