مرکز منطقه ای اطلاع رساني علوم و فناوري - Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS

Author/Authors :

A. Boulton، نويسنده , , D. Fornasiero، نويسنده , , J. Ralston، نويسنده ,

DocumentNumber :

1284878

Title Of Article :

Characterisation of sphalerite and pyrite flotation samples by XPS and ToF-SIMS

شماره ركورد :

8990

From Page :

205

NaturalLanguageKeyword :

Pyrite , selective flotation , X-ray photoelectron spectroscopy , sphalerite , Time of Flight Secondary IonMass Spectroscopy

JournalTitle :

Studia Iranica

To Page :

219

To Page :

219

Link To Document :