• DocumentCode
    1000416
  • Title

    Indirectly coupled films

  • Author

    Bruyere, J.C. ; Clerc, G. ; Massenet, O. ; Paccard, D. ; Montmory, R. ; Neel, L. ; Valin, J. ; Yelon, A.

  • Author_Institution
    Laboratoire d´´Electrostatique et de Physique du Métal, C.N.R.S., Grenoble, France
  • Volume
    1
  • Issue
    3
  • fYear
    1965
  • fDate
    9/1/1965 12:00:00 AM
  • Firstpage
    174
  • Lastpage
    180
  • Abstract
    A positive coupling has been observed between magnetic films separated by a thin metallic layer. Five methods which have been developed for measuring this coupling and the variation of the coupling with evaporation temperature, measuring temperature, and thickness of the intermediate layer are described. Three mechanisms are proposed for the observed coupling : bulk diffusion of ferromagnetic atoms into the intermediate layer, diffusion of magnetic atoms along grain boundaries, and polarization of conduction electrons. The effect of this coupling on slow switching, pulse switching, and creep is discussed.
  • Keywords
    Multilayer magnetic films; Atomic layer deposition; Atomic measurements; Couplings; Electrons; Grain boundaries; Magnetic films; Magnetic separation; Optical polarization; Temperature measurement; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1965.1062946
  • Filename
    1062946
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1000416