DocumentCode :
1000607
Title :
International Test Conference 1986
Volume :
3
Issue :
4
fYear :
1986
Abstract :
Provides a listing of upcoming conference events of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.294969
Filename :
4069827
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1000607
