• DocumentCode
    1000644
  • Title

    High-frequency intensity noise behaviour during accelerated life tests of narrow-stripe proton-isolated DH AlGaAs lasers for optical communications

  • Author

    Biesterbos, J.W.M. ; Salemink, H.W.M.

  • Author_Institution
    Philips Research Laboratories, Eindhoven, Netherlands
  • Volume
    18
  • Issue
    7
  • fYear
    1982
  • Firstpage
    300
  • Lastpage
    302
  • Abstract
    An investigation has been made into the influence of life testing of narrow-stripe proton-isolated DH AlGaAs on their output fluctuation spectra in the range 0.1¿1.6 GHz. The lasers show intrinsic optical fluctuation behaviour before life testing. The experiments indicate that this behaviour is maintained for facet-coated lasers during at least 5000 h of accelerated life testing at elevated temperatures.
  • Keywords
    III-V semiconductors; aluminium compounds; electron device noise; gallium arsenide; life testing; optical communication equipment; semiconductor device testing; semiconductor junction lasers; 0.1 to 1.6 GHz; accelerated life tests; facet-coated lasers; high frequency intensity noise behaviour; narrow stripe laser; optical communications; output fluctuation spectra; proton-isolated DH AlGaAs lasers; semiconductor laser;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19820205
  • Filename
    4249663
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1000644