DocumentCode
1000651
Title
International Test Conference
Volume
3
Issue
4
fYear
1986
Abstract
Provides a listing of upcoming conference events of interest to practitioners and researchers.
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1986.294973
Filename
4069831
Link To Document