Measurement of useful properties of memory devices

It is customary to measure properties of a memory device in terms of a specific mode of memory operation. Estimating device properties relevant to a different operating mode is usually difficult, if not impossible. At the present time, memory configurations are growing in number and in basic function, ranging widely in size, speed, power, and read/write patterns. It is often necessary to select an available device for a new memory scheme. It is occasionally of interest to select a memory scheme to make best use of a device. A set of simply measured characteristic curves is proposed, which would make it possible to evaluate a given memory device in a large number of operating modes. The quantities involved are the flux, switched by pulses limited in time, amplitude, and number; reversible and irreversible flux switching; and dc properties. Examples of the use of the curves are given.