DocumentCode :
1001051
Title :
Direct comparison of two independent Josephson voltage standards at 1 V and precision measurements up to 10 V
Author :
Pöpel, R. ; Niemeyer, J. ; Grimm, L. ; Dünschede, F. ; Meier, W.
Author_Institution :
Phys.-Tech. Bundesanstalt, Bundesalle, Germany
Volume :
40
Issue :
5
fYear :
1991
fDate :
10/1/1991 12:00:00 AM
Firstpage :
805
Lastpage :
810
Abstract :
Two Josephson voltage standards have been compared using a room-temperature electronic nanovoltmeter with a peak-to-peak noise of about 2 nV at the 1-V level corresponding to a RMS uncertainty of 4×10-10. The excellent stability in maintaining the desired voltage steps makes it possible to obtain recorder traces comparing Nb/Al2O3/Nb Josephson standards with Weston cells and Zener reference standards at 1 V and 10 V. At 10 V the best result shows a peak-to-peak noise of 250 nV corresponding to a RMS uncertainty of 5×10-9 for a Zener reference and 50 nV corresponding to 1×10-9 for a series connection of nine Weston cells. As an example for the application of the Josephson standard as a potentiometer the deviation in the linearity of a digital voltmeter is confirmed to be on the order of 0.1 p.p.m. in the range from -10 V to +10 V
Keywords :
Josephson effect; measurement standards; stability; superconducting junction devices; voltage measurement; 1 V; 10 V; Josephson voltage standards; Nb-Al2O3-Nb; Weston cells; Zener reference standards; digital voltmeter; linearity; peak-to-peak noise; potentiometer; room-temperature electronic nanovoltmeter; stability; voltage steps; Linearity; Measurement standards; Niobium; Noise measurement; Particle measurements; Semiconductor device measurement; Temperature; Uncertainty; Voltage; Voltmeters;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.106301
Filename :
106301
Link To Document :
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