• DocumentCode
    1001051
  • Title

    Direct comparison of two independent Josephson voltage standards at 1 V and precision measurements up to 10 V

  • Author

    Pöpel, R. ; Niemeyer, J. ; Grimm, L. ; Dünschede, F. ; Meier, W.

  • Author_Institution
    Phys.-Tech. Bundesanstalt, Bundesalle, Germany
  • Volume
    40
  • Issue
    5
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    805
  • Lastpage
    810
  • Abstract
    Two Josephson voltage standards have been compared using a room-temperature electronic nanovoltmeter with a peak-to-peak noise of about 2 nV at the 1-V level corresponding to a RMS uncertainty of 4×10-10. The excellent stability in maintaining the desired voltage steps makes it possible to obtain recorder traces comparing Nb/Al2O3/Nb Josephson standards with Weston cells and Zener reference standards at 1 V and 10 V. At 10 V the best result shows a peak-to-peak noise of 250 nV corresponding to a RMS uncertainty of 5×10-9 for a Zener reference and 50 nV corresponding to 1×10-9 for a series connection of nine Weston cells. As an example for the application of the Josephson standard as a potentiometer the deviation in the linearity of a digital voltmeter is confirmed to be on the order of 0.1 p.p.m. in the range from -10 V to +10 V
  • Keywords
    Josephson effect; measurement standards; stability; superconducting junction devices; voltage measurement; 1 V; 10 V; Josephson voltage standards; Nb-Al2O3-Nb; Weston cells; Zener reference standards; digital voltmeter; linearity; peak-to-peak noise; potentiometer; room-temperature electronic nanovoltmeter; stability; voltage steps; Linearity; Measurement standards; Niobium; Noise measurement; Particle measurements; Semiconductor device measurement; Temperature; Uncertainty; Voltage; Voltmeters;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.106301
  • Filename
    106301