DocumentCode :
1001063
Title :
Computer-Aided-Design Research at the Ge Microelectronics Center
Author :
Hightower, David ; de Geus, Aart ; Fasang, Patrick ; Griffin, Robert ; Leive, Gary
Author_Institution :
General Electric Corporation
Volume :
3
Issue :
5
fYear :
1986
Firstpage :
49
Lastpage :
56
Abstract :
In late 1980, the GE Microelectronics Center (MEC) was established to develop a proprietary gate array program for infusing JC technology into GE products. One team developed a CAD system helping engineers through the complete design cycle from circuit description capture and simulation to layout, post-layout simulation, processing, and test. Another team developed a gate array CMOS process at the 1 ¿ fabrication facility in North Carolina´s Research Triangle Park opened in June 1982.
Keywords :
CMOS process; CMOS technology; Circuit simulation; Circuit testing; Computational modeling; Design automation; Design engineering; Microelectronics; System testing; Systems engineering and theory;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1986.295066
Filename :
4069871
Link To Document :
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