Title :
Formation of barium strontium titanate thin films via electrophoretic deposition process
Author :
Wang, Hong-Wen ; Cheng, Pei-Chi ; Liang, Cheng-Feng ; Chang, Yu-Shan
Author_Institution :
Dept. of Chem., Chung-Yuan Christian Univ., Chungli
fDate :
12/1/2008 12:00:00 AM
Abstract :
Synthesis of crystalline barium stronium titanate (Ba0.6Sr0.4TiO3) nanoparticles and subsequent formation of thin films have been carried out. The crystalline products were confirmed by X-ray diffractometry. Uniform Ba0.6Sr0.4TiO3 thin films were formed by using electrophoretic deposition method (EPD) under a 0.3 to 5 V dc bias for 10 min to 1 h. Ba0.6Sr0.4TiO3 nanoparticles having an average crystallite size of 20 to 50 nm, and Ba0.6Sr0.4TiO3 thin films with thickness of 150 nm to 4 mum were obtained. A scanning electron microscope (SEM) and transmission electron microscope (TEM) were used to characterize the morphologies of nanoparticles and thin films. The results show that the EPD process route is a rapid, cost-effective alternative for forming Ba0.6Sr0.4TiO3 thin films.
Keywords :
X-ray diffraction; barium compounds; electrophoretic coating techniques; nanoparticles; nanotechnology; scanning electron microscopy; strontium compounds; thin films; transmission electron microscopy; Ba0.6Sr0.4TiO3; SEM; TEM; X-ray diffractometry; barium strontium titanate thin films; crystalline products; electrophoretic deposition process; nanoparticle synthesis; scanning electron microscopy; size 150 nm to 4 mum; size 20 nm to 50 nm; time 1 h; time 10 min; transmission electron microscopy; voltage 0.3 V to 5 V; Barium; Crystallization; Nanoparticles; Scanning electron microscopy; Sputtering; Strontium; Titanium compounds; Transistors; Transmission electron microscopy; X-ray diffraction; Barium Compounds; Crystallography, X-Ray; Electrochemistry; Metal Nanoparticles; Microscopy, Electron, Scanning; Microscopy, Electron, Transmission; Oxides; Strontium; Surface Properties; Temperature; Titanium;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2008.969