DocumentCode :
1001139
Title :
Comparison of surface and volume coercive field of sputtered CoCr thin films
Author :
Smits, J.W. ; Luitjens, S.B. ; Geuskens, R. W J ; Smits, J. ; Luitjens, S. ; Geuskens, R.
Author_Institution :
Philips Research Laboratories, JA Eindhoven, The Netherlands
Volume :
20
Issue :
1
fYear :
1984
fDate :
1/1/1984 12:00:00 AM
Firstpage :
60
Lastpage :
62
Abstract :
Thin films of the perpendicular recording material Co78.5Cr21.5were prepared by RF sputtering from a composite target. The film thickness was varied from 31 nm to 773 nm. Using Si
Keywords :
Chromium; Magnetic field measurement; Magnetic films; Magnetometers; Optical films; Perpendicular magnetic recording; Radio frequency; Sputtering; Substrates; Surface cracks;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1984.1063018
Filename :
1063018
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1001139
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