• DocumentCode
    1001139
  • Title

    Comparison of surface and volume coercive field of sputtered CoCr thin films

  • Author

    Smits, J.W. ; Luitjens, S.B. ; Geuskens, R. W J ; Smits, J. ; Luitjens, S. ; Geuskens, R.

  • Author_Institution
    Philips Research Laboratories, JA Eindhoven, The Netherlands
  • Volume
    20
  • Issue
    1
  • fYear
    1984
  • fDate
    1/1/1984 12:00:00 AM
  • Firstpage
    60
  • Lastpage
    62
  • Abstract
    Thin films of the perpendicular recording material Co78.5Cr21.5were prepared by RF sputtering from a composite target. The film thickness was varied from 31 nm to 773 nm. Using Si
  • Keywords
    Chromium; Magnetic field measurement; Magnetic films; Magnetometers; Optical films; Perpendicular magnetic recording; Radio frequency; Sputtering; Substrates; Surface cracks;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1984.1063018
  • Filename
    1063018
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1001139