Title :
Self-Test in a Standard Cell Environment
Author :
Mucha, J.P. ; Daehn, W. ; Gross, J.
Author_Institution :
University of Hanover, FRG
Keywords :
Automatic testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Costs; Manufacturing; Packaging; Performance loss; Registers;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.1986.295051
