DocumentCode

1001296

Title

Self-Test in a Standard Cell Environment

Author

Mucha, J.P. ; Daehn, W. ; Gross, J.

Author_Institution

University of Hanover, FRG

Volume

3

Issue

6

fYear

1986

Firstpage

35

Lastpage

41

Keywords

Automatic testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Costs; Manufacturing; Packaging; Performance loss; Registers;

fLanguage

English

Journal_Title

Design & Test of Computers, IEEE

Publisher

ieee

ISSN

0740-7475

Type

jour

DOI

10.1109/MDT.1986.295051

Filename

4069898