Title :
Full temperature single event upset characterization of two microprocessor technologies
Author :
Nichols, Donald K. ; Coss, James R. ; Smith, L. S Ted ; Rax, Eernard ; Huebner, Mark ; Watson, Kevin
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
fDate :
12/1/1988 12:00:00 AM
Abstract :
Data for the Fairchild 9450 I3L bipolar microprocessor and the Harris 80C86 CMOS/epi (vintage 1985) microprocessor are presented, showing single-event soft errors for the full mil-spec temperature range of -55°C to 125°C. These data show for the first time that the soft-error cross sections continue to decrease with decreasing temperature at subzero temperatures. The temperature dependence of the two parts, however, is very different
Keywords :
CMOS integrated circuits; bipolar integrated circuits; microprocessor chips; radiation effects; -55 to 125 degC; Fairchild 9450 I3L bipolar microprocessor; Harris 80C86 CMOS/epi; full mil-spec temperature range; microprocessor technologies; single event upset characterization; soft errors; soft-error cross sections; subzero temperatures; CMOS technology; Copper; Laboratories; Microprocessors; Nitrogen; Single event upset; Temperature control; Temperature distribution; Temperature sensors; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
