• DocumentCode
    1001452
  • Title

    A summary of SEU test results using Californium-252

  • Author

    Harboe-Sorensen, R. ; Adams, L. ; Sanderson, T.K.

  • Author_Institution
    European Space Agency, Noordwijk, Netherlands
  • Volume
    35
  • Issue
    6
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    1622
  • Lastpage
    1628
  • Abstract
    The authors summarize four years of single-event-upset test results on a wide range of devices and technologies using Californium-252 having an average linear energy transfer of 43 MeV/(mg/cm2). Sensitivity variations are highlighted, particularly for nominally identical devices. The significance of the testing and test data with respect to recent devices and technologies is discussed
  • Keywords
    integrated circuit testing; radiation effects; semiconductor device testing; 252Cf; SEU test results; average linear energy transfer; nominally identical devices; single-event-upset test results; test data; Computer aided software engineering; Energy exchange; Immune system; Laboratories; Manufacturing; Performance evaluation; Single event upset; Software testing; Space technology; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.25509
  • Filename
    25509
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1001452