DocumentCode
1001483
Title
Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation
Author
Browning, J.S. ; Holtkamp, D.B.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
Volume
35
Issue
6
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
1629
Lastpage
1633
Abstract
Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations. The spectra can be used to access microelectronics vulnerabilities in strategic-nuclear-weapon, space-trapped, and neutral-beam directed-energy particle environments
Keywords
Monte Carlo methods; neutron effects; packaging; proton effects; Monte Carlo theoretical calculations; linear energy transfer spectra; microelectronics packaging materials; microelectronics vulnerabilities; neutral-beam directed-energy particle environments; neutron irradiations; proton irradiation; space-trapped environments; strategic-nuclear-weapon; Crystalline materials; Detectors; Dielectric materials; Etching; Insulation life; Microelectronics; Neutrons; Packaging; Particle tracking; Protons;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.25510
Filename
25510
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