Title :
Particle LET spectra from microelectronics packaging materials subjected to neutron and proton irradiation
Author :
Browning, J.S. ; Holtkamp, D.B.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fDate :
12/1/1988 12:00:00 AM
Abstract :
Cumulative fractions for linear energy transfer spectra were measured for particles ejected from microelectronics packaging materials subjected to neutron and proton irradiations. The measurements for the neutron irradiations compare well with Monte Carlo theoretical calculations. The spectra can be used to access microelectronics vulnerabilities in strategic-nuclear-weapon, space-trapped, and neutral-beam directed-energy particle environments
Keywords :
Monte Carlo methods; neutron effects; packaging; proton effects; Monte Carlo theoretical calculations; linear energy transfer spectra; microelectronics packaging materials; microelectronics vulnerabilities; neutral-beam directed-energy particle environments; neutron irradiations; proton irradiation; space-trapped environments; strategic-nuclear-weapon; Crystalline materials; Detectors; Dielectric materials; Etching; Insulation life; Microelectronics; Neutrons; Packaging; Particle tracking; Protons;
Journal_Title :
Nuclear Science, IEEE Transactions on
