DocumentCode
1001734
Title
Two frequency radar interferometry applied to the measurement of ocean wave height
Author
Weissman, David E.
Author_Institution
Hofstra Univ., Hempstead, NY, USA
Volume
21
Issue
5
fYear
1973
fDate
9/1/1973 12:00:00 AM
Firstpage
649
Lastpage
656
Abstract
A technique is developed for measuring the rms wave height averaged over an area of the sea that is much greater than any horizontal scale of the surface waves. The method involves a nadir looking radar which transmits and receives two monochromatic signals simultaneously. Signal processing at the receiver involves the computation of the correlation between the two returning signals as a function of theft variable frequency separation. The cross correlation between the amplitude and phase functions of the individual returning carriers depends on the distribution of discrete scatterers along the direction of propagation. This information can be used to determine the rms surface elevation (about the mean); it does not depend on the temporal or spatial frequency spectrum of the wave height or slope. Under conditions which are typical for a microwave signal being normally incident and reflected by the sea, the two frequency correlation function
is seen to be equal to the characteristic function of the surface elevation of specular points. Laboratory measurements have been conducted on wind driven waves, and the measured correlation function compares favorably with the theory developed here.
is seen to be equal to the characteristic function of the surface elevation of specular points. Laboratory measurements have been conducted on wind driven waves, and the measured correlation function compares favorably with the theory developed here.Keywords
Radar interferometry; Sea surface electromagnetic scattering; Area measurement; Frequency measurement; Ocean waves; Radar interferometry; Radar scattering; Radar signal processing; Sea measurements; Sea surface; Signal processing; Surface waves;
fLanguage
English
Journal_Title
Antennas and Propagation, IEEE Transactions on
Publisher
ieee
ISSN
0018-926X
Type
jour
DOI
10.1109/TAP.1973.1140593
Filename
1140593
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